Structural and morphological characterization
•
X-ray
diffraction
(XRD):
Phase
identification,
raw
materials
recognition,
estimation
of
structural purity, crystallinity, average crystal size, crystal phase quantification.
•
Elemental
analysis
by
X-ray
photoelectron
spectroscopy
(XPS):
chemical
bonding
analysis,
depth
profile
elemental
analysis,
XPS
chemical
mapping,
thickness/stoichiometry-dependent
elemental
analysis
and/or
chemical
valence
analysis. XPS/XAES spectroscopy combined with Argon ions etching.
•
Scanning
electron
microscopy
(SEM-EDS):
Morphology
study
and
imaging,
plane
view cross section view, elemental analysis with linear scan and mapping.
Instrumentation
•
X-ray
photoelectron
and
Auger
electron
spectroscopy
(XPS/AES)
by
Kratos
Analytical
(Α
Shimadzu
group
company)
Axis
Ultra
DLD
combined
with
Auger
Scanning electron microscopy (SAM/AES)
•
2-cycles
X-ray
diffractometers
with
Bragg-Brentano
geometry,
Rigaku
Ultima
Plus
and Philips PW 1050
•
2-cycles X-ray diffractometers with transmission beam geometry, Seifert C3000
•
Field-emission
Scanning
electron
microscopy,
JEOL
JSM-7610F
Plus
supported
by
an
Oxford
AZTEC
ENERGY
ADVANCED
X-act
energy
dispersive
X-ray
spectroscopy (EDS) system.
Publications
1
.
D.
Karfaridis,
L.
Mihalceanu,
S.
Keller,
K.
Simeonidis,
G.P.
Dimitrakopulos,
T.
Kehagias,
E.T.
Papaioannou,
G.
Vourlias,
Influence
of
the
Pt
thickness
on
the
structural
and
magnetic
properties
of
epitaxial
Fe/Pt
bilayers
,
Thin
Solid
Films.
694
(2020) 137716. doi:10.1016/j.tsf.2019.137716
2
.
Papadopoulos,
G.,
Asimakidou,
T.,
Karfaridis,
D.,
Kellartzis,
I.,
Vourlias,
G.,
Mitrakas,
M.,
Simeonidis,
K.
An
optimized
Cr(VI)-Removal
system
using
Sn-based
reducing
adsorbents
(2019) Water (Switzerland), 11 (12), art. no. 2477.
3
.
Mourlas,
A.,
Pavlidou,
E.,
Vourlias,
G.,
Rodríguez,
J.,
Psyllaki,
P.
Concentrated
solar
energy
for
in-situ
elaboration
of
wear-resistant
composite
layers.
Part
I:
TiC
and
chromium
carbide
surface
enrichment
of
common
steels
(2019)
Surface
and
Coatings Technology, 377, art. no. 124882.
4
.
A.
Touni,
A.
Papaderakis,
D.
Karfaridis,
G.
Vourlias,
S.
Sotiropoulos,
Oxygen
evolution
reaction
at
IrO2/Ir(Ni)
film
electrodes
prepared
by
galvanic
replacement
and
anodization:
Effect
of
precursor
Ni
film
thickness
,
Molecules.
24
(2019)
1–16.
doi:10.3390/molecules24112095.
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CHARACTERIZATION,
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